Petri dish surface. Coloured atomic force micrograph (AFM) of the surface of a petri dish. Fibres of plastic can be seen. An atomic force microscope is used to study surfaces at an atomic level. An extremely fine spring-mounted probe is moved across the surface at a constant height. Any deflections are recorded and converted into a computer map of the surface. Magnification: x33,330 when printed at 10 centimetre wide.
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Details
Creative#:
TOP03198458
Source:
達志影像
Authorization Type:
RM
Release Information:
須由TPG 完整授權
Model Release:
N/A
Property Release:
N/A
Right to Privacy:
No
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