Silicon wafer. Light micrograph of the etched surface of a silicon wafer. Light refraction is shown in this Epi Nomarski differential contrast technique. Magnification: x63 at 35mm size; x126 at 5x7cm size.

px px dpi = cm x cm = MB
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TOP22306588

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達志影像

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RM

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須由TPG 完整授權

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N/A

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